Application Note #139 AFM and Raman Spectroscopy —Correlated Imaging and Tip Enhanced Raman Scattering
ثبت نشده
چکیده
understand complex systems and better engineer their functions has been driving scanning probe microscopies since their inception (see figure 1). Both atomic force microscopy (AFM) and Raman spectroscopy are techniques used to gather information about the surface properties and chemical information of a sample. There are many reasons to combine these two technologies, and this application note discusses both the complementary information gained from the techniques and how a researcher having access to a combined system can benefit from the additional information available. Two Surface Analysis Methods
منابع مشابه
Raman Spectroscopy and Microscopy Enable Life Science Discoveries
The field of medical diagnostics will have tremendous potential gains in the near future due to Raman spectroscopy and microscopy. Applications include surface-enhanced Raman spectroscopy (SERS), signal enhancement targeted to specific analytes, coupling atomic force microscopy (AFM) systems and enabling tip-enhanced Raman spectroscopy (TERS) for nanoscale resolution. These technologies highlig...
متن کاملTip-enhanced Raman spectroscopy and related techniques in studies of biological materials
Biological materials can be highly heterogeneous at the nanometer scale. The investigation of nanostructures is often hampered by the low spatial resolution (e.g. spectroscopic techniques) or very little chemical information (e.g. atomic force microscopy (AFM), scanning tunneling microscopy (STM)) provided by analytical techniques. Our research focuses on combined instruments, which allow the a...
متن کاملTip-enhanced Raman spectroscopic imaging of localized defects in carbon nanotubes
We used tip-enhanced Raman spectroscopy to study defect induced D-band Raman scattering in metallic single-walled carbon nanotubes with a spatial resolution of 15 nm. The spatial extent of the D-band signal in the vicinity of localized defects is visualized and found to be about 2 nm only. Using the strong optical fields underneath the tip, we photogenerate localized defects and derive a relati...
متن کاملComparative study of atomic force mode and tunneling mode tip-enhanced Raman spectroscopy
In Tip-Enhanced Raman Spectroscopy (TERS) a metal (or metallized) sharp tip is used to enhance the electromagnetic field by a localized surface-plasmon excitation. Two different modes – atomic force mode (AFM) and scanning tunneling mode (STM) – together with their respective types of probe tips are used in TERS experiments. We have compared the efficiency in enhancing the Raman signal on a thi...
متن کاملTip in–light on: Advantages, challenges, and applications of combining AFM and Raman microscopy on biological samples
Scanning probe microscopies and spectroscopies, especially AFM and Confocal Raman microscopy are powerful tools to characterize biological materials. They are both non-destructive methods and reveal mechanical and chemical properties on the micro and nano-scale. In the last years the interest for increasing the lateral resolution of optical and spectral images has driven the development of new ...
متن کامل